XRS-FP2 is our quantitative analysis XRF software package for Windows PCs. It features materials and thin film analysis for XRF or EPXA (SEM-EDS/Microanalysis) spectroscopy techniques. The software allows for complete XRF analysis using a comprehensive fundamental parameter (FP) model for either bulk materials or single-layer thin-film materials. Multi-layer analysis for thickness and composition can be achieved with as few as a single standard calibration. Further capabilities include complete modeling of detectors and X-ray sources. The XRF software is also able to simulate complete spectra using user defined input parameters of a sample.
Our software package for every use case
Main Features
Standardless Analysis
Elements
Experimental Conditions
Bulk Materials
Multi Layers
Spectrum Processing
Peak/Element ID
Spectrum Display
Spectra Simulation
Quantification
XRS-FP2
BULK
Main Features : Software package for the analysis of bulk or single-layer thin-film materials.
Standardless Analysis : Bulk Or Fixed Layers
Elements : 55
Experimental Conditions : 8
Bulk Materials
Multi Layers
Spectrum Processing
Peak/Element ID
Spectrum Display
Spectra Simulation
Quantification: FP, LSQ, SIR-FP
XRS-FP2 MTF
MULTI-LAYER
Main Features : Software package for the analysis of thickness and composition of multilayers.
Standardless Analysis : Bulk Or Fixed Layers
Elements : 55
Experimental Conditions : 8
Bulk Materials
Multi Layers : up to 8
Spectrum Processing
Peak/Element ID
Spectrum Display
Spectra Simulation
Quantification: MTFFP2, LSQ, SIR-FP
XRS-FP2 EPXA
SEM-EDS
Main Features : Software package for SEM-EDS analysis.
Standardless Analysis : Bulk Or Fixed Layers
Elements : 55
Experimental Conditions : 1
Bulk Materials
Multi Layers
Spectrum Processing
Peak/Element ID
Spectrum Display
Spectra Simulation
Quantification: ZAF calculations for SEM spectra. Cliff-Lorimer calculations for TEM spectra